As test targets shrink, the benefits of socketless probing technology grow. As technology advances, more and more electronic components that do bigger and better things are hitting the market. At the ...
Wireless fixtures for in-circuit testing (ICT) have been available for more than 15 years and have no equal in testing high node-count complex circuit boards. However, there are other hidden ...
In the first two articles of SI/PI MasterClass, I showed how you can create simple fixtures to characterize small discrete components. In “Solder-wick trick characterizes bypass caps” [1], you can ...
This article summarizes the content of a paper jointly developed and presented by Advantest and Infineon at TestConX 2022. Device under test (DUT) fixtures for ATE systems pose several verification ...
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