Support grids are a key part of electron microscopy measurements; the choice of the grid can directly influence the quality and accuracy of the final image. This is particularly true for transmission ...

In transmission electron microscopy (TEM), where the electron beam passes through the sample to be directly imaged on the detector below, it is often necessary to support the thin samples on a grid.

Researchers performing cryo-EM experiments can acquire the training to make their own cryo-EM and negative-stain grids, and collect and process their own high-resolution data. We also offer sample ...