Definition: Kelvin Probe Force Microscopy (KPFM), also known as Surface Potential Microscopy, is a cutting-edge scanning probe microscopy technique that measures the surface potential of materials at ...

Scanning probe microscopy (SPM) encompasses a diverse range of techniques that enable the interrogation of surfaces with atomic-scale precision. These methods, including atomic force microscopy (AFM), ...

Force microscopy is a family of scanning probe microscopy techniques that enable the visualization and manipulation of materials at the nanoscale. These techniques rely on the interaction forces ...

Using a Kelvin probe force microscope, scientists visualized how chiral perovskites regulate electron spin, offering new insights that could guide the design of next-generation spintronic devices.

An AFM instrument uses a probe with an atomically sharp tip to scan over the surface of a material. There are two main scanning modes with an AFM instrument: contact or dynamic (tapping) mode. Both ...

Kelvin Probe Force Microscopy (KPFM) has emerged as a critical technique for the nanoscale investigation of electrical properties, enabling detailed mapping of surface potential and contact potential ...