Test facilities are beginning to implement real-time maintenance, rather than scheduled maintenance, to reduce manufacturing costs and boost product yield. Adaptive cleaning of probe needles and test ...

Researchers at the National Institute of Standards and Technology (NIST) have devised a system for manipulating and precisely positioning individual nanowires on semiconductor wafers. Their technique ...

Learn how to minimize connection changes, opportunities for user error, and frustration when performing comprehensive DC I-V and C-V testing of power semiconductor devices. Aug. 10, 2020 Measuring DC ...

Wafer-level burn-in is Aehr's key differentiator: the company says its FOX systems and patented WaferPak enable screening of failing devices before advanced packaging and are offered as a turnkey ...

Power semiconductors such as MOSFETs and IGBTs need measurements and characterization while still on the wafer—for both engineering and production. Thus, you need to probe the wafer. The TESLA200 ...

The testing of the semiconductor dies produced by a wafer fabrication plant involves a long series of operations requiring meticulous care. The time spent performing these tests markedly affects both ...

The move to multi-die packaging is driving chipmakers to develop more cost-effective ways to ensure only known-good die are integrated into packages, because the price of failure is significantly ...

In this interview, Dr. Chady Stephan, PhD, the Applied Markets Leader at PerkinElmer, talks to AZoM about the current trends shaping semiconductor wafer manufacturing. A semiconductor is a material ...

Computing and datacom organizations are on a constant quest to unveil the latest achievement in data speeds and computing power. Many industry experts expect chip-to-chip and on-chip photonics to be ...

FREMONT, Calif., Feb. 20, 2019 (GLOBE NEWSWIRE) -- Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it has received a $2.4 ...